![Radiation Enclosure](http://mrlweb.mrl.ucsb.edu/sites/default/files/styles/medium_large/public/mrl_images/instruments/mrd-pro-I-enc_0.jpg?itok=5vSP93HM)
![Inside View](http://mrlweb.mrl.ucsb.edu/sites/default/files/styles/medium_large/public/mrl_images/instruments/mrd-pro-I-inside_0.jpg?itok=tzeGNTnu)
Features
- X-ray sources: 2.2 kW Philips ceramic sealed tube source
- Wavelength: Cu Ka (1.5405 Å)
- Monochromator: High flux hybrid monochromator or 4-crystal Ge(220)/(440)
- Diffracted beam optics: receiving slits & Ge (220) analyzer for triple axes
- Goniometer: open Eulerian cradle
- Detector: sealed proportional counter
- Resolution: ~5 arcsec in q and 2q-q scans
- Software for data acquisition: X’PERT Data Collector
- Software for data processing: X’PERT Epitaxy and X'PERT Reflectivity
Example of XRD data collected on MRD
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GaN (002) rocking curve with superlattice peaks |
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X-ray Reflectivity (XRR) data and simulation of a PMMA film on Si |
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High resolution x-ray rocking curve data on a multi-quantum well structure |
Lab:
Location:
1409 CNSI
Instrument Information and/or Manual:
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