Microscopy and Microanalysis facility houses state-of-the-art equipment for materials characterization including 2 transmission electron microscopes; 3 field-emission scanning electron microscopes; 2 atomic force microscopes; an advanced focused ion-beam system; dedicated X-ray photoelectron spectrometer (XPS) and dynamic secondary ion mass spectrometer (DSIMS) systems; and extensive sample preparation tools and computational resources.

Instruments
AFM teaser

Atomic Force Microscopy

The Atomic Force Microscope (AFM) is an essential surface analysis tool used for high-resolution imaging and quantitative measurement of critical material properties on a variety of material surfaces.

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Focused Ion Beam Microscopy

FIB has become a quintessential tool in modern transmission electron microscopy due to its unique ability to extract TEM samples from very specific regions of the material.

SEM teaser

Scanning Electron Microscopy

SEM provides strong topographic information on the materials coupled with element-specific data via energy-dispersive X-ray spectroscopy (EDX).

XPS teaser

Surface Analysis

The UCSB Materials Microscopy and Microanalysis lab has facilities for measuring the elemental and chemical makeup of the surface and near-surface regions of solid samples.

TEM teaser

Transmission Electron Microscopy

TEM and STEM provide a versatile and powerful set of tools that allow the exploration of materials morphology, chemistry, and crystallography on the nanometer scale down to the atomic level.